50x 100x DIC Prism for Delphi-X Inverso Inverted Microscopy, Material Science - Euromex

Take advantage of precise contrast enhancement and seamless integration with the Delphi‑X Inverso series for reliable material analysis at high magnification; choose expert advice from Metav Werkzeuge for configuration and procurement.

DIC prism for Delphi‑X Inverso — Material science differential interference contrast module for 50× and 100× objectives (Euromex)

The DIC prism for Delphi‑X Inverso is an optical accessory engineered to provide differential interference contrast imaging for material science inspections using 50× and 100× objectives.

• Compatible with Delphi‑X Inverso microscopes
• Optimised for 50× and 100× objectives
• Enhances surface and relief contrast
• Simple mechanical integration into condenser path

Reveal fine surface relief for clearer defect detection

The DIC approach emphasises minute variations in optical path length, converting subtle topography into visible contrast without staining or destructive preparation. For material inspection this means improved visibility of scratches, edges and layered structures, enabling earlier detection of defects and clearer documentation of surface conditions. The prism module provides controlled shear and bias retardation so that surface relief becomes more apparent under 50× and 100× magnifications, supporting repeatable evaluations in routine quality checks.

Seamless compatibility reduces setup time

Designed for the Delphi‑X Inverso instrument family, the accessory aligns with existing optical and mechanical interfaces to ensure straightforward installation and fast return to productive use. The compact prism module fits into the condenser path and requires minimal adjustment when switching between objectives, which helps to maintain inspection throughput on the production floor. Where alignment is needed, simple mechanical locks and centring features keep the optical axis stable, reducing the need for frequent recalibration.

Practical advantages for lab and workshop workflows

Integrating differential interference contrast into a materials workflow delivers sharper edges and improved feature separation on reflective and semi‑transparent specimens. This optical enhancement supports nondestructive testing, documentation and comparative analysis without additional sample preparation steps. The accessory is intended as a precise optical tool for visual inspection and documentation tasks, improving decision confidence in routine metrology and research contexts.

Versatile application across material science tasks

The prism module is suitable for a range of material science uses where surface morphology matters: failure analysis, coating inspection, microstructure observation and routine quality assurance. By accentuating surface gradients and microrelief, the device aids both qualitative assessment and photographic documentation under high magnification. The optical improvement complements other contrast techniques and integrates into established microscopy protocols used in laboratories and industry.

Contact Metav Werkzeuge to discuss how the Euromex DIC prism DI.9691-51 can be configured for an existing Delphi‑X Inverso setup or to request tailored advice from our consultants based in Emmerich

Technical Data

• Article number: DI.9691-51
• Label: DIC prism for Delphi‑X Inverso — Material science for 50× and 100× objectives
• UID: DI.9691-51

Facts

• Suitable magnifications: 50×, 100×
• Model series: Delphi‑X Inverso
• Product type: Accessory / Component

Special features

• Application: material science differential interference contrast
• Manufacturer: Euromex
• Compatibility: Delphi‑X Inverso microscope series

FAQ

What does differential interference contrast achieve for material inspections?
Differential interference contrast emphasises tiny optical path differences to make surface relief, scratches and edges more visible during material inspections with the Euromex DIC prism DI.9691-51.

Is the prism compatible with all Delphi‑X Inverso configurations?
The prism is designed for the Delphi‑X Inverso series and integrates with standard condenser paths; specific configurations should be confirmed against the Delphi‑X Inverso setup and DI.9691-51 specifications.

Can the DIC module be used with other objectives besides 50× and 100×?
The DI.9691-51 is optimised for 50× and 100× objectives; use with other magnifications may require optical adjustments and is not covered by the standard optimisation.

Will the accessory affect routine calibration or maintenance schedules?
Once installed, the prism generally requires only routine optical alignment; maintenance follows normal microscope procedures and should be scheduled as part of standard instrument care.

Which applications benefit most from installing this prism?
The module supports failure analysis, surface inspection, coating evaluation and other material science tasks where enhanced surface contrast at high magnification is required with the Euromex accessory DI.9691-51.

Manufacturer: Euromex Microscopen bv; Typograaf 8; 6921 VB Duiven; The Netherlands; info@euromex.com