5x 20x DIC Prism for Delphi-X Inverso Contrast Enhancement - Euromex

Take advantage of precise differential interference contrast for low‑magnification inspections together with full compatibility with the Delphi‑X Inverso series; the accessory supports both 5× and 20× objectives for reliable materials‑science imaging. Order this component directly via Metav Werkzeuge or contact the consultants for tailored advice.

DIC prism DI.9691-52 — Accessory for Delphi‑X Inverso, suited to 5× and 20× objectives (Euromex)

A DIC prism DI.9691-52 designed for materials‑science applications on the Delphi‑X Inverso inverted microscope, delivering differential interference contrast at low magnifications.

• DIC prism for Delphi‑X Inverso
• Designed for materials science use
• Suitable for 5× and 20× objectives
• Accessory for inverted Delphi‑X series

Improved contrast for coarse structural inspection

The DIC element enhances edge definition and surface relief when inspecting metallographic samples and structured specimens at lower magnifications. By converting phase gradients into intensity differences, the prism produces clearer visual separation of features that would otherwise be hard to distinguish under standard brightfield illumination. The resulting images support faster, more reliable qualitative assessments during incoming inspection and routine materials analysis, reducing the need for repeated sample preparation.

Seamless compatibility with inverted systems and optical workflow

Engineered for use with the Delphi‑X Inverso range, the prism integrates into the optical path without altering the core illumination geometry of the inverted microscope. Installation is straightforward and preserves existing alignment of condensers and objectives; the component is intended to work with the specified 5× and 20× objective magnifications to deliver optimal interference effects. This compatibility keeps instrument setup times short and maintains laboratory throughput while ensuring consistent imaging performance across batches.

Practical benefits for materials‑science laboratories

For laboratories focusing on metallography, failure analysis or sample characterisation, this DIC accessory brings a pragmatic balance of performance and simplicity. The prism accentuates fine surface topography and microstructural contrasts, aiding visual defect recognition and documentation. As part of a standardised inspection routine, it reduces subjective interpretation by offering repeatable optical enhancement, supporting traceable results in reports and quality records.

Clear handling, maintenance and usage considerations

The accessory is intended as a supplement to existing optics rather than a replacement for specialised high‑magnification DIC objectives; it is optimised for the specified low magnifications. Routine cleaning with appropriate optical solvents and lint‑free tissues preserves the optical surfaces and performance. For clarification on mechanical fit or to confirm compatibility with an individual system configuration, technical documentation and support are available on request via the contact channels below.

Contact Metav Werkzeuge for tailored compatibility checks and to secure the DI.9691-52 DIC prism for Delphi‑X Inverso, ensuring reliable contrast enhancement for materials‑science inspections

Technical data

• Article number: DI.9691-52
• Label: DIC prism for Delphi‑X Inverso — materials science

Facts

• Compatible objective magnifications: 5×, 20×

Special features

• DIC prism
• Compatible with Delphi‑X Inverso
• Accessory / component
• Application: materials science

FAQ

What magnifications does the prism support? The prism is specified for use with 5× and 20× objectives to produce differential interference contrast suited to low‑magnification materials inspections.

Is the component compatible with the Delphi‑X Inverso series? Yes, the DI.9691-52 prism is designed for integration with the Delphi‑X Inverso inverted microscope series and aligns with its optical path requirements.

Can the prism be used for routine metallographic inspection? The accessory improves surface relief and edge contrast for metallographic samples and is intended to support routine materials‑science assessments.

Does the prism replace high‑magnification DIC objectives? No, the prism supplements existing optics for enhanced low‑magnification contrast and is not a substitute for dedicated high‑magnification DIC objectives.

Where can I obtain further technical specifications or fitting instructions? Detailed documentation and fitting advice are available from Metav Werkzeuge and from Euromex; project‑specific compatibility checks can be arranged on request.

Manufacturer: Euromex Microscopen bv; Typograaf 8; 6921 VB Duiven; The Netherlands; info@euromex.com