30mm Delphi-X Observer Trinocular Microscope SWF 10x/25mm Eyepieces Plan Semi-Apo & Plan Apo Objectives, 100W Incident Light - Euromex

Take advantage of high-quality optics and a robust mechanical stage to speed up materials inspection while maintaining consistent results; the trinocular design and 100 W incident illumination enable efficient imaging and documentation workflows. Order the instrument directly via Metav Werkzeuge or consult the Metav team for specifications and delivery.

Delphi-X Observer — Trinocular metallurgical microscope with plan semi-apo and plan apo objectives

The Delphi-X Observer is a trinocular metallurgical microscope designed for material science inspection, combining high-contrast plan semi-apochromatic and plan apochromatic objectives with a sturdy stage for repeatable sample handling.

• Trinocular head for simultaneous imaging and documentation
• SWF 10x eyepieces, 25 mm field number
• Plan semi-apo and plan apo objectives
• 210 x 170 mm stage with 105 x 105 mm cross table

Reliable optics for consistent material characterisation

The optical configuration focuses on repeatability and clarity: plan semi-apo objectives (5x, 10x, 20x) and a Plan Apo 50x lens deliver corrected flat fields and reduced chromatic aberration, which is essential when comparing surface features or microstructures across multiple samples. The instrument features SWF 10x eyepieces with a 25 mm field number and 30 mm diameter, providing a wide, comfortable viewing field for detailed observation. The optical train is listed as EIS 45 mm parfocal, which maintains focus across objective changes and reduces inspection time by avoiding frequent refocusing. This optical stability supports an efficient quality control loop in production and research environments.

Illumination and stage engineered for materials workflows

A dedicated 100 W incident illumination system supplies stable, high-intensity light for reflective samples common in metallurgical and materials laboratories. Combined with the 210 x 170 mm stage and a 105 x 105 mm cross table, the setup allows precise sample positioning and movement control during examinations or when capturing sequential images. These mechanical and illumination choices minimise downtime between measurements and help maintain throughput while preserving image contrast on polished or etched surfaces.

Documentation-friendly head and operator comfort

The trinocular head permits parallel observation and camera attachment for digital documentation, enabling easy image capture without interrupting microscopy work. Comfortable, wide-field eyepieces and a parfocal optical path reduce operator fatigue during extended sessions and improve consistency when multiple technicians perform the same inspection routine. The instrument supports laboratory workflows that require both visual assessment and archived imaging for traceability or reporting.

Built for laboratory reliability and integration

Constructed for materials science applications, the instrument integrates optical and mechanical elements to deliver sustained performance in lab conditions. The flat-field objectives and the parfocal design reduce recalibration needs, while the robust stage supports repeatable measurements. As part of a controlled procurement strategy, this system fits into inspection stations where precision and long-term reliability are priorities, complementing other metrology equipment in the workshop or research facility.

Contact Metav Werkzeuge for tailored advice on specifications, availability and delivery from Emmerich; reach out via info@metav-werkzeuge.com or call +49 2822 7131930 to discuss integration into existing inspection workflows

Technical data

• SKU: DX.2053-PLMi
• Product type: Microscope
• Model series: Delphi-X Observer
• Manufacturer: Euromex
• Head: trinocular

Core specifications

• Eyepiece magnification: 10x
• Field number: 25 mm
• Eyepiece diameter: 30 mm
• Stage size: 210 x 170 mm
• Cross table travel: 105 x 105 mm
• Illumination: 100 W incident illumination
• Parfocal distance: 45 mm

Special features

• SWF eyepieces
• Plan semi-apo objectives 5x / 10x / 20x
• Plan Apo objective 50x
• EIS 45 mm parfocal
• Material science objectives
• Trinocular head for documentation

FAQ

What objectives are included for material inspection?
The instrument is supplied with plan semi-apo objectives at 5x, 10x and 20x plus a Plan Apo 50x suitable for detailed metallurgical analysis.

Can the optical head be used with a camera for documentation?
Yes, the trinocular head supports simultaneous visual observation and camera attachment for imaging and record keeping.

How does the parfocal specification affect workflow?
The EIS 45 mm parfocal distance ensures the sample remains in focus when switching objectives, reducing refocus time and increasing inspection throughput.

What stage dimensions and travel are available for sample movement?
The instrument features a 210 x 170 mm stage with a 105 x 105 mm cross table for accurate lateral positioning and repeatable measurements.

Is the illumination suitable for reflective samples?
The microscope uses a 100 W incident illumination system designed to provide stable light for reflective and polished specimens in materials science.

Manufacturer: Euromex Microscopen bv, Typograaf 8, 6921 VB Duiven, The Netherlands, info@euromex.com