30mm Delphi-X Observer Trinocular Microscope Plan PLPOLi Objectives 10x/25mm, Polariser 360° - Euromex

Take advantage of precise polarisation optics, a trinocular imaging port and both transmitted and reflected 100 W illumination for reliable material analysis and efficient documentation. Order the instrument directly via Metav Werkzeuge or contact our consultants for tailored advice.

Delphi‑X Observer trinocular microscope — Euromex polarisation system with 100 W illumination

The Delphi‑X Observer is a trinocular microscope tailored for polarised‑light inspection, materials analysis and routine laboratory documentation, combining stress‑free polarising objectives with robust imaging and illumination options

• Trinocular head for simultaneous observation and imaging
• SWF 10x / 25 mm eyepieces for wide field viewing
• Polarisation optics with 360° rotator and compensators
• Parfocal EIS 60 mm objectives for fast objective changes

Reliable polarised imaging for material and geological inspection

The optical concept centres on plan PLPOLi objectives (5/10/20/50 IOS) that are optimised for stress‑free polarised observations; this yields even field flatness and accurate birefringence visualisation, which is essential when distinguishing crystal structures or residual stresses. The inclusion of compensators and a rotatable polariser (360°) provides controlled manipulation of the polarisation state, enabling consistent contrast adjustment and repeatable analytical conditions across sessions. Such optical stability reduces interpretation errors and speeds decision making in quality checks.

Faster documentation and reduced downtime with trinocular design

A trinocular head with a dedicated imaging path permits simultaneous visual inspection and camera capture, streamlining reporting and traceability in the laboratory. The optical train is parfocal at an EIS 60 mm setting, so swapping between objectives maintains focus and cuts re‑focusing time when moving from overview to detail. Wide‑field SWF 10x / 25 mm eyepieces ease specimen navigation and reduce eye strain during prolonged use, improving operator efficiency and throughput for inspection workflows.

Versatile sample handling and illumination for diverse applications

A 190 mm circular stage combined with both transmitted and reflected 100 W illumination supports a broad range of samples and techniques, from thin petrographic sections to polished metallographic specimens. The presence of an analyser slider alongside the polariser and compensators allows rapid configuration for crossed polar or conoscopic observations. Dual illumination enables inspection of both surface features and internal structures without swapping instruments, making the system suitable for geology, metallurgy and advanced education.

Designed for consistent results and straightforward operation

Controls and optical arrangements are configured to favour repeatability: the polarisation accessories and parfocal objectives ensure that a defined setup produces comparable images session after session, supporting reliable routine testing. The instrument’s combination of polarising optics, stable illumination and a documentation port strengthens laboratory protocols and reduces training time for new users, while enabling experienced personnel to focus on analysis rather than constant re‑adjustment.

For procurement or technical consultation regarding this Euromex polarising microscope, contact Metav Werkzeuge for expert guidance and supply from Emmerich: email info@metav-werkzeuge.com or call +49 2822 7131930 — Metav Werkzeuge assists with product selection and delivery across Europe

Technical data

• Article number: DX.2053-PLPOLRi
• Product type: microscope
• Model series: Delphi‑X Observer
• Head type: trinocular
• Eyepiece type: SWF
• Eyepiece field number (mm): 25
• Eyepiece magnification: 10x
• Objectives: plan PLPOLi 5/10/20/50 IOS
• Parfocal distance: EIS 60 mm
• Stage diameter: 190 mm
• Polariser rotation: 360°
• Analysers: slider with analyser
• Compensators: included
• Illumination: transmitted and reflected, 100 W
• Manufacturer: Euromex
• UID: DX.2053-PLPOLRi

Core specifications

• Eyepiece magnification: 10x
• Eyepiece field number: 25 mm
• Parfocal distance: 60 mm
• Stage diameter: 190 mm
• Illumination power: 100 W

Special features

• Trinocular head for camera port
• Stress‑free polarisation objectives
• 360° rotatable polariser
• Analysers and compensators included
• Plan optics for flatfield imaging
• Transmitted and reflected illumination

FAQ

What polarisation accessories are included with the instrument?
The Delphi‑X Observer is supplied with a polariser rotatable through 360°, a slider with analyser and compensators, enabling standard polarising and compensator techniques for material contrast enhancement.

Can a camera be fitted to the trinocular port?
Yes, the trinocular head provides an imaging path for camera attachment; the dedicated port supports documentation and simultaneous visual inspection.

How does parfocality benefit day‑to‑day use?
Parfocal objectives at the specified EIS 60 mm distance keep the image in focus during objective changes, reducing re‑focusing time and improving inspection efficiency with the Delphi‑X Observer.

Which sample types are suitable for this microscope?
The combination of transmitted and reflected 100 W illumination and polarisation optics makes the system well suited to thin sections, polished metallographic pieces and other specimens used in geology, metallurgy and materials science.

Are the eyepieces suitable for long observation sessions?
Wide‑field SWF 10x / 25 mm eyepieces provide a comfortable viewing field, aiding specimen navigation and reducing operator fatigue during extended analysis.

Manufacturer: Euromex Microscopen bv, Typograaf 8, 6921 VB Duiven, The Netherlands, info@euromex.com