30 mm Delphi-X Observer Trinocular Microscope Plan Semi-Apo/Plan Apo Objectives, 10x/25 mm SWF Eyepieces - Euromex

Take advantage of a high‑performance optical platform combined with ergonomic handling and robust mechanical control to improve inspection throughput and documentation quality. Order the Delphi‑X Observer directly via Metav Werkzeuge or consult our specialists for application advice.

Delphi‑X Observer trinocular microscope with ergonomic swivelling head and plan APO optics

A Delphi‑X Observer trinocular microscope is optimised for materials science inspection and documentation, offering plan semi‑APO and plan APO objectives with parfocal performance.

• Trinocular head with ergonomic swivelling design
• SWF 10x eyepieces, 25 mm field number
• Plan semi‑APO 5/10/20x and plan APO 50x objectives
• 210 x 170 mm stage with 105 x 105 mm cross table
• 100 W reflected illumination for materials inspection

Reliable imaging for materials analysis and documentation

The optical train combines plan semi‑APO and plan APO objectives with SWF 10x eyepieces (25 mm field number), delivering flat field reproduction and improved colour fidelity for metallography and failure analysis. With EIS 45 mm parfocal spacing, objective changes retain focus, reducing cycle time during multi‑magnification inspections. This configuration supports clear, comparable images across magnifications, which accelerates decision making in testing and quality control.

Ergonomic design that speeds routine inspection

The trinocular head with an ergonomically swivelling design improves operator comfort during prolonged examinations and simplifies camera alignment for digital capture. The 210 x 170 mm stage combined with a 105 x 105 mm cross table enables precise sample positioning and repeatable measurements on uneven or irregular specimens. Mechanical stability and smooth translation reduce repositioning errors and contribute to reproducible inspection results on the shop floor.

Illumination and optical control for clearer surface detail

Equipped with a 100 W reflected illumination unit, the instrument provides high‑contrast lighting suitable for reflective samples commonly found in materials science. Parfocal optics maintain image plane consistency when changing objectives, while the trinocular port allows simultaneous observation and imaging without interrupting the inspection workflow. These features reduce procedure steps and improve throughput for documentation and reporting tasks.

Built for consistent performance and integration

Constructed for routine laboratory and workshop use, the system balances optical capability with robust mechanical components to ensure day‑to‑day reliability. The instrument is suitable for metallurgical examination, component inspection and educational laboratories that require both visual assessment and digital documentation. For additional technical specifications or compatibility questions regarding camera integration, refer to the technical data below or contact Metav Werkzeuge for detailed advice.

For tailored advice on integrating the Delphi‑X Observer into inspection workflows or to arrange procurement through Metav Werkzeuge, please contact our consultants by email or phone — expert support is available from Emmerich to the entire European market.

Technical data

• Article number: DX.2058-PLMi
• Label: Delphi‑X Observer, trinocular microscope with ergonomic swivelling head, SWF 10x/25 mm Ø 30 mm eyepieces, plan semi‑APO 5/10/20x and plan APO 50x IOS materials science objectives, EIS 45 mm parfocal, 210 x 170 mm stage with 105 x 105 mm cross table and 100 W reflected illumination
• Manufacturer: Euromex

Numbers / Core technical data

• Eyepiece magnification: 10x
• Eyepiece field number: 25 mm
• Objective magnifications: 5x, 10x, 20x (plan semi‑APO); 50x (plan APO)
• Parfocal spacing: EIS 45 mm
• Stage size: 210 x 170 mm
• Cross table travel: 105 x 105 mm
• Illumination: 100 W reflected light

Designs / Special features

• Head type: trinocular, ergonomically swivelling
• Optics: plan semi‑APO and plan APO objectives
• Eyepiece type: SWF (super wide field)
• Application focus: materials science, metallography, inspection
• Compatible with camera via trinocular port

FAQ

What magnifications are included with this microscope?
The instrument is supplied with plan semi‑APO objectives at 5x, 10x and 20x and a plan APO 50x objective, combined with SWF 10x eyepieces for standard observation.

Can the trinocular port be used for a camera without disturbing observation?
Yes, the trinocular head supports simultaneous visual observation and camera attachment; the ergonomic swivelling design simplifies alignment for digital documentation.

How does the parfocal feature affect workflow?
The EIS 45 mm parfocal spacing keeps focus when switching objectives, minimising refocusing time and improving inspection throughput.

Is this system suitable for metallurgical sample inspection?
The optical and illumination setup, together with reflected light capability, makes the system well suited to metallurgical and materials science examinations.

What stage precision can be expected for repeatable positioning?
The 210 x 170 mm stage with 105 x 105 mm cross table provides fine mechanical control for repeatable sample positioning during inspections.

Manufacturer / Responsible: Euromex Microscopen bv; Typograaf 8; 6921 VB Duiven; The Netherlands; info@euromex.com