30mm Delphi-X Observer Trinocular Microscope Plan Semi-Apo 5/10/20x, Plan Apo 50x IOS Objectives 45mm Parfocal, 210x170mm Stage with 105x105mm Cross Table 100W Transmitted and Reflected Halogen - Euromex

The combination of an ergonomically swivelling trinocular head, high-contrast 100 W halogen transmitted and reflected illumination and precision optics delivers reliable, lab-grade imaging for materials inspection and documentation; benefit from a stable 210 × 170 mm stage with a 105 × 105 mm cross table for repeatable sample positioning. Order the Euromex Delphi‑X Observer directly via Metav Werkzeuge or consult our specialists for application advice.

Delphi‑X Observer trinocular microscope with ergonomic swivel head and plan semi-apochromatic optics by Euromex

The Delphi‑X Observer is a trinocular microscope designed for materials science applications, combining an ergonomically swivelling head with a robust stage and dual halogen illumination for precise sample inspection and imaging.

• Trinocular head with ergonomic swivel
• Plan semi-apochromatic objectives 5×–50×
• 210 × 170 mm stage with 105 × 105 mm cross table
• 100 W halogen transmitted and reflected illumination

Clear, reliable imaging for materials analysis

The instrument offers a trinocular head mounted on an ergonomically swivelling mechanism to reduce operator strain during prolonged use while supporting camera attachment for documentation. The optical configuration includes SWF 10× eyepieces with a 25 mm field number and high-quality plan objectives, delivering flatter fields and enhanced edge-to-edge sharpness. These optical choices ensure consistent visual assessment and accurate image capture for metallography, failure analysis and component inspection.

Precision sample handling and repeatable positioning

A large 210 × 170 mm mechanical stage paired with a 105 × 105 mm cross table provides secure sample support and fine positional control for multi-step inspections. The rigid stage construction promotes repeatability when moving between inspection points, which reduces set-up time and improves throughput in a lab or workshop environment. For tasks that require systematic comparisons, the stable platform keeps measurement uncertainty low and sample alignment straightforward.

High-contrast illumination for clearer diagnostics

Both transmitted and reflected 100 W halogen illumination deliver high-intensity, continuous light suited to a variety of materials, from polished metals to coated samples. The dual-mode lighting enables contrast enhancement without complex filters, making surface features, grain structures and defects more visible. Together with plan semi-apochromatic and plan apochromatic 50× objectives, the lighting supports clear, reproducible observations across magnifications.

Optics and parfocal convenience for efficient workflow

The optical train features plan semi-apochromatic objectives at 5×, 10× and 20×, plus a plan apochromatic 50× objective optimised for materials work. An EIS 45 mm parfocal arrangement reduces refocusing when changing magnification, saving time during multi-scale inspections and documentation tasks. This parfocal consistency helps maintain image plane alignment for photographic recording and eases the transition between overview and detail views.

Ergonomic design and documentation-ready configuration

Ergonomic engineering extends beyond the swivelling head: the trinocular configuration allows seamless switching between binocular observation and camera-based capture, supporting quality assurance workflows and traceable inspection records. The combination of robust mechanics and high-quality optics creates a compact observation station suitable for both workshop benches and laboratory tables, facilitating precise observations without sacrificing operator comfort.

Contact Metav Werkzeuge today to discuss integrating the Euromex Delphi‑X Observer into production QA or to arrange a technical consultation — email: info@metav-werkzeuge.com | Tel: +49 2822 7131930

Technical Data

• Article number: DX.2058-PLMRi
• Model series: Delphi‑X Observer
• Product type: Microscope
• Manufacturer: Euromex

Facts

• Head type: Trinocular
• Eyepiece magnification: 10×
• Eyepiece field number: 25 mm
• Eyepiece diameter: 30 mm
• Objective magnifications: 5×, 10×, 20×, 50×
• Parfocal distance: 45 mm (EIS)
• Mechanical stage size: 210 × 170 mm
• Cross table travel: 105 × 105 mm
• Illumination: 100 W halogen transmitted and reflected

Special features

• Ergonomically swivelling head
• SWF 10×/25 mm eyepieces
• Plan semi-apochromatic objectives
• Plan apochromatic 50× objective
• IOS material science objectives
• Parfocal EIS 45 mm

FAQ

What magnifications are available with this microscope?
The Euromex Delphi‑X Observer is equipped with plan semi-apochromatic objectives at 5×, 10× and 20× and a plan apochromatic 50× objective, combined with 10× eyepieces for a practical magnification range.

Is the system suitable for materials science and metallography?
Yes, the optics and illumination arrangement of the Delphi‑X Observer are optimised for materials science applications, providing the contrast and resolution needed for metallographic inspection and surface analysis.

How does the parfocal system benefit workflow?
The EIS 45 mm parfocal design keeps the image plane aligned when changing magnifications on the Delphi‑X Observer, reducing the need to refocus and speeding up multi-scale examinations.

Can a camera be attached for documentation?
The trinocular configuration supports camera attachment, enabling easy photographic documentation of observations for quality records and reporting with the Euromex Delphi‑X Observer.

What stage control and repeatability does the system offer?
The large 210 × 170 mm stage with a 105 × 105 mm cross table provides precise, repeatable sample positioning for comparative inspections and routine quality checks.

Manufacturer: Euromex Microscopen bv, Typograaf 8, 6921 VB Duiven, Nederland, info@euromex.com