37.5mm 4x Microscope Objective 0.10 NA Working Distance 37.5 mm - Euromex

Take advantage of the combination of reliable low‑magnification imaging, a generous working distance and clear optical specifications for efficient sample inspection. Order directly via Metav Werkzeuge or consult the Metav team for integration advice.

Microscope objective AE.5591 — 4× magnification, NA 0.10, long working distance (Euromex)

Microscope objective AE.5591 delivers low‑magnification overview imaging for educational and routine inspection tasks, offering a balance of field of view and sample access.

• 4× magnification for overview imaging
• 37.5 mm working distance for sample access
• Numerical aperture 0.10 for clear low‑mag observations

Faster inspection through clear, low‑magnification optics

The combination of 4× magnification and a numerical aperture of 0.10 provides a practical balance between field size and image contrast, making the objective well suited to rapid visual screening and alignment tasks. At low magnification the optical design emphasises a broad field of view and stable contrast rather than extreme resolving power; this means larger samples and assemblies can be examined without frequent refocussing. The specified 37.5 mm working distance further supports handling and manipulation of specimens under the lens, enabling measurement fixtures or probing tools to be used without compromising the working clearance.

Practical benefits for laboratory and teaching environments

A low‑power objective with a wide depth of field improves the usability of microscopes in multi‑user settings where fast, repeatable results are required. The modest numerical aperture reduces sensitivity to slight illumination changes, which simplifies setup with reflectors, LED rings or transmitted light stages commonly found in teaching and quality control benches. This results in more consistent images during routine checks and reduces the time needed for operator training. The optical specification is therefore an asset where throughput and straightforward handling are priorities.

Clear specifications for system integration and selection

Specification details are concise and measurable: magnification 4×, numerical aperture 0.10 and working distance 37.5 mm (listed as 4x/0.10 SMP objective, WD 37.5 mm in the manufacturer PDF). These figures allow direct comparison with other objectives when planning optical chains, camera matching or specimen staging. The straightforward optical parameters support predictable imaging behaviour and help with decisions on camera sensor size, eyepiece selection and illumination strategy. For the microscope objective AE.5591, the available data from the manufacturer’s education materials enables rapid assessment for educational labs, inspection stations and similar use cases.

For procurement or technical advice on integration with existing microscope stands, contact Metav Werkzeuge — the Metav team can advise on compatibility and supply arrangements from Emmerich.

Technical Data

• Article number: AE.5591
• SKU: AE.5591
• Manufacturer: Euromex
• Product type: Microscope objective

Facts

• Magnification: 4×
• Working distance: 37.5 mm
• Numerical aperture: 0.10

Special features

• 4x/0.10 SMP objective specification
• Source: Education PDF‑S. 13

FAQ

What magnification does this objective provide?
The objective offers 4× magnification, suitable for overview imaging and initial inspection tasks with the Euromex microscope objective AE.5591.

How much working distance is available for sample handling?
The objective specifies a 37.5 mm working distance, providing ample clearance for probes, fixtures or manipulation during inspections.

What level of resolution can be expected from a numerical aperture of 0.10?
A numerical aperture of 0.10 gives good contrast and sufficient resolving power for low‑magnification applications; it is optimised for overview and alignment rather than fine microstructural analysis.

Is this objective suitable for educational or routine inspection use?
Yes; the combination of wide field of view, stable contrast and extended working distance makes the AE.5591 well suited to education, quality control and general inspection benches.

Where are the specification details sourced from?
Specifications are taken from the manufacturer’s documentation (Education PDF‑S. 13) and are summarised for clear comparison in the technical data above.

Manufacturer / Responsible: Metav Werkzeuge GmbH; Parkring 45; 46446 Emmerich; Germany; +49 2822 7131930; info@metav-werkzeuge.com